LeCroy
Corporation, a supplier of oscilloscopes, protocol analyzers and serial
data test solutions, today announced the launch of a new class of
instrument, the SPARQ series of Signal Integrity Network Analyzers. The
SPARQ measures 40 GHz S-parameters on up to 4-ports with single button
press operation at a small fraction of the cost of traditional methods
such as Vector Network Analyzers. With the low price and ease of use of
the SPARQ, multi-port S-parameter measurements are now accessible to a
much wider audience.
The
SPARQ is a time domain instrument, using TDR/T technology along with
patented LeCroy innovations to rapidly acquire waveforms and measure the
S-parameters of a device under test. The SPARQ measures both frequency
and time domain results, and outputs standard Touchstone S-parameter
files that are ready to be loaded into the user’s simulation software.
The unit is small, rugged, PC-based and portable, and includes all of
the hardware and software tools required by the signal integrity
engineer for characterizing passive devices.
The
SPARQ calibrates using an OSLT calibration kit that is internal to the
unit. This allows the calibration and measurement to proceed
automatically with a single button click and without any need to connect
and disconnect calibration standards. With the SPARQ, the painstaking,
lengthy and error-prone calibration procedure is once and for all
eliminated. The “E” model SPARQ units include the internal calibration
capability standard, and also support manual calibration using an
external calibration kit. Setting up the SPARQ is also fast and easy;
all configurations for the S-parameter measurements are contained within
a single setup screen.
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